3142074 Ecoflam  OP-TRONCHETTO CURVA RP2 L450
3142074 Ecoflam OP-TRONCHETTO CURVA RP2 L450
产品价格:¥面议(人民币)
  • 供应数量:1
  • 发货地:福建-厦门市
  • 最小起订量:1件
  • 家家通会员
    会员级别:家家通会员
    认证类型:企业认证
    企业证件:通过认证

    商铺名称:厦门纪扬科技有限公司

    联系人:李经理(先生)

    联系手机:

    固定电话:

    企业邮箱:624232572@qq.com

    联系地址:福建厦门市鼓岩路1号华论国际大厦1003

    邮编:

    联系我时,请说是在勒克斯之家上看到的,谢谢!

    商品详情



      3142074 Ecoflam  OP-TRONCHETTO CURVA RP2 L450















      LAM Research 2300v2 KIYO EX Poly Polysilicon Etch
      Lam Research 4506I Plasma Etch
      Lam Research 4506I Plasma Etch
      Lam Research 4526I Plasma Etch
      Lam Research 4526I Plasma Etch
      Lam Research 4526I Plasma Etch
      Lam Research 4526I Plasma Etch
      Lam Research 4526XL Plasma Etch
      Lam Research 4526XL Plasma Etch
      Lam Research 4528I Plasma Etch
      Lam Research 4528XL Plasma Etch
      LAM Research 2300e4 Exelan Flex GX Dielectric Etch
      LAM Research 2300e4 KIYO EX Polysilicon Etch
      LAM Research 2300e4 KIYO EX Metal Metal Etch
      LAM Research 2300e4 KIYO MCX Dry Etch
      LAM Research 2300e5 KIYO EX Polysilicon Etch
      LAM Research 2300e5 KIYO EX Polysilicon Etch
      LAM Research 2300e6 KIYO EX Polysilicon Etch
      LAM Research Alliance 9400 PTX Plasma etcher with 2 x plasma etch chambers
      LAM Research Alliance (A6) Exelan HP - Spare Parts Dielectric Etch
      LAM Research Alliance (A6) TCP 9400DFM Polysilicon Etch
      LAM Research Alliance (A6) TCP 9400DFM Polysilicon Etch
      LAM Research Alliance (A6) TCP 9400DSiE G Polysilicon Etch
      LAM Research Alliance (A6) TCP 9400DSiE III Polysilicon Etch
      LAM Research Alliance (A6) TCP 9400DSiE III Polysilicon Etch
      LAM Research ALTUS CVD System
      LAM Research ALTUS CVD System
      LAM Research ALTUS CVD System
      LAM Research C3 SPEED MAX (LITE) STI cvd 3CH
      LAM Research Rainbow 4520i Dielectric Etch
      LAM Research Rainbow 4520i Dielectric Etch
      LAM Research Rainbow 4520i Dielectric Etch
      LAM Research Rainbow 4520XL Dielectric Etch
      LAM Research TCP 9600SE Metal Etch
      LAM Research TCP 9600SE Metal Etch
      LAM Research TCP 9600SE Metal Etch
      LAM Research TCP 9600SE Metal Etch
      LAM Research TCP 9600SE Metal Etch
      LAM Research TCP 9600SE Metal Etch
      LAM Research TCP 9600SE Metal Etch
      LAM Research TCP 9600SE Metal Etch
      LAM Research TCP 9600SE Metal Etch
      LAM Research TCP 9600SE Metal Etch
      Lam Research TCP 9600SE II standalone with DSQ Plasma Etch
      Lam Research Ontrak Synergy Post CMP cleaner with HEPA mini-environment
      Lam Research Ontrak Synergy Post CMP cleaner with HEPA mini-environment
      LAMBDA PHYSIK Novaline K2005 248 nm excimer laser for ASML /300
      LASER & PHYSICS SISCAN-2-M7325 Mask Test Machine
      LASERTEC BGM300 Wafer Inspection System
      LASERTEC BGM300 Wafer Surface Analyzing and VIsualization System
      Lasertec M6641 Reticle Inspection
      LAURIER DS9000 PICK AND PLACE
      Laurier DS-7000T/R Die Pick and Sort
      LEATHERWOOD LPD333.FR4.FT Semi-Auto Automated 6' Acid Wet Bench, for up to 6" Wafers, Excellent Condition
      LEATHERWOOD PLASTICS CUSTOM 6' SOLVENT BENCH REAR EXHAUST
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope
      LEICA ERGOLUX 200 Metrology Defect Inspection – Wafer Inspection Microscope



    在线询盘/留言
  • 0571-87774297